Work

Highly Reliable and Secure PUF Using Resistive Memory Integrated Into a 28 nm CMOS Process

Year: 2023

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2023.3251953

Authors: Tsegereda K. Esatu, Amit Prakash, Zhi Li, Derek Lau, Sung Hyun Jo, Tsu-Jae King Liu

Institution: University of California, Berkeley

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4323644347

FWCI: 2.51

Cites: 26

Cited by: 12

Related to: 10