Work

A new multiple dependent state sampling plan based on one-sided process capability indices

Year: 2023

Type: article

Source: The International Journal of Advanced Manufacturing Technology

DOI: 10.1007/s00170-023-11310-7

Authors: Ching-Ho Yen, Chia-Hao Chang, Chun-Chia Lee

Institutions: Huafan University, Minnan Normal University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: Ministry of Science and Technology, Taiwan

Award: Designing an Improved Sampling Plan Based on Process Yield Index through Exponentially Weighted Moving Average Method

OpenAlex ID: W4362470345

FWCI: 0.816

Cites: 31

Cited by: 8

Related to: 10