Impact of Depth-Wise Inhomogeneous Iron Distributions on the Accuracy of Lifetime-Based Interstitial Iron Measurements on Silicon Wafers
Year: 2023
Type: article
Source: IEEE Journal of Photovoltaics
Institution: Australian National University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G8605162071
OpenAlex ID: W4362563563
