Work

Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy

Year: 2023

Type: article

Source: Integrating materials and manufacturing innovation

DOI: 10.1007/s40192-023-00295-6

Authors: Pin-Hua Huang, Ryan Coffee, Leora Dresselhaus-Marais

Institutions: Stanford University, SLAC National Accelerator Laboratory

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4366728381

FWCI: 1.107

Cites: 9

Cited by: 6

Related to: 10