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Malware Classification using Deep Learning Techniques

Year: 2023

Type: conference-paper

Source: IEEE Delhi Section Conference (DELCON)

DOI: 10.1109/delcon57910.2023.10127303

Authors: Bhavya Dawra, Ananya Navneet Chauhan, Ritu Rani, Amita Dev, Poonam Bansal, Arun Sharma

Institution: Indira Gandhi Delhi Technical University for Women

Language: English

Topic: Advanced Malware Detection Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4377703001

FWCI: 1.239

Cites: 22

Cited by: 7

Related to: 10