Work

Origin of frequency and voltage dependent negative dielectric properties in the Al/p-Si Schottky diodes with (Cd0.3Zn0.7O) interfacial layer in the wide range of frequency and voltage

Year: 2023

Type: article

Source: Physica B Condensed Matter

DOI: 10.1016/j.physb.2023.415031

Authors: N. Delen, S. Altındal Yerişkin, A. Özbay, İ. Taşçıoğlu

Institutions: Gazi University, Istanbul Topkapi University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4378840094

FWCI: 1.928

Cites: 49

Cited by: 32

Related to: 10