Work

A New Convolutional Neural Network for Identification of Damaged Electronic Components

Year: 2022

Type: conference-paper

Source: International Conference on Universal Village (UV)

DOI: 10.1109/uv56588.2022.10185470

Authors: Fei Teng, Longfei Zhou, Haoliang Liu, Qingyangg Zhao, Zehang Li, Pengfei Liu, Yonggen Dai, Lu Gao, Zhichao Gou, Jiazheng Chen, Jiasheng Yang

Institutions: South China University of Technology, Duke University, Duke Medical Center, Nanjing University of Information Science and Technology, Jiangsu University, Jiangnan University, Northern Arizona University, Beijing Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4385270504

FWCI: 0.374

Cites: 16

Cited by: 1

Related to: 10