New Methods of Measuring a Key Elastic-Piezoelectric Constant of Thin Films
Year: 1996
Type: conference-paper
Authors: Fred J. von Preissig, Hong Zeng, Eun Sok Kim
Institution: University of Hawaiʻi at Mānoa
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4385293757