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EUV debris mitigation using magnetic nulls
Work
Year: 2023
Type: article
Abstract: Next generation EUV sources for photolithography use light produced by laser-produced plasmas (LPP) from ablated tin droplets. A major challenge for extending the lifetime of these devices is mitigati... more
Cites: 25
Cited by: 3
Related to: 10
FWCI: 0.63
Citation percentile (by year/subfield): 67.65
Open Access status: green
Grant ID DE-AC02- 09CH11466