Work

A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryogenic Device Characterization in 40-nm CMOS Technology

Year: 2023

Type: conference-paper

Source: IEEE MTT-S International Microwave Symposium digest

DOI: 10.1109/ims37964.2023.10188078

Authors: Yi-Ting Chen, Ian Huang, Min-Jui Lin, Shu-Yan Chuang, Hua Ling Ho, Kai-Syang Hsu, Pin-Yu Lin, Sih-Ying Chen, Liang-Hung Lu, Shih-Yuan Chen, Jiun-Yun Li, Jun-Chau Chien

Institutions: National Taiwan University, University of California, Berkeley

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Education, National Science and Technology Council

OpenAlex ID: W4385337638

FWCI: 1.538

Cites: 8

Cited by: 3

Related to: 10