Year: 2023
Type: preprint
Abstract: Anomaly detection has gained considerable attention due to its broad range of applications, particularly in industrial defect detection. To address the challenges of data collection, researchers have introduced zero-/few-shot anomaly detection techniques that require minimal normal images for each category. However, complex industrial scenarios often involve multiple objects, presenting a significant challenge. In light of this, we propose a straightforward yet powerful multi-scale memory comparison framework for zero-/few-shot anomaly detection. Our approach employs a global memory bank to capture features across the entire image, while an individual memory bank focuses on simplified scenes containing a single object. The efficacy of our method is validated by its remarkable achievement of 4th place in the zero-shot track and 2nd place in the few-shot track of the Visual Anomaly and Novelty Detection (VAND) competition.
Source: arXiv (Cornell University)
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4385750138