Work

Angelic Patches for Improving Third-Party Object Detector Performance

Year: 2023

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr52729.2023.02360

Authors: Wenwen Si, Shuo Li, Sangdon Park, Insup Lee, Osbert Bastani

Institutions: University of Pennsylvania, Georgia Institute of Technology

Language: English

Topic: Adversarial Robustness in Machine Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4386076692

FWCI: 0.317

Cites: 31

Cited by: 2

Related to: 10