RF Desense Risk Prediction using EM Simulation
Year: 2023
Type: conference-paper
Authors: Gokul Ramsubbaraj, Leo Cheng, Krishna Rao
Institution: Google (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Google
OpenAlex ID: W4386631477