Micromotion compensation of trapped ions by qubit transition and direct scanning of dc voltages
Year: 2023
Type: article
Abstract: Excess micromotion is detrimental to accurate qubit control of trapped ions, thus measuring and minimizing it is crucial. In this paper, we present a simple approach for measuring and suppressing excess micromotion of trapped ions by leveraging the existing laser-driven qubit transition scheme combined with direct scanning of dc voltages. The compensation voltage is deduced by analyzing the Bessel expansion of a scanned qubit transition rate. The method provides a fair level of sensitivity for practical quantum computing applications, while demanding minimal deviation of trap condition. By accomplishing compensation of excess micromotion in the qubit momentum-excitation direction, the scheme offers an additional avenue for excess micromotion compensation, complementing existing compensation schemes.
Source: Optics Express
DOI: 10.1364/oe.497721
Authors: Woojun Lee, Daun Chung, Jiyong Kang, Honggi Jeon, Changhyun Jung, Dong-Il Dan Cho, Taehyun Kim
Institution: Seoul National University
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,270
Funder: Samsung
Award: G2290628374
OpenAlex ID: W4386863492
