Work

Atom counting from a combination of two ADF STEM images

Year: 2023

Type: article

Source: Ultramicroscopy

DOI: 10.1016/j.ultramic.2023.113859

Authors: D.G. Şentürk, C.P. Yu, A. De Backer, S. Van Aert

Institution: University of Antwerp

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W4386986984

FWCI: 0.353

Cites: 53

Cited by: 4

Related to: 10