Work

A Pixel-Level Segmentation Convolutional Neural Network Based on Global and Local Feature Fusion for Surface Defect Detection

Year: 2023

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2023.3323004

Authors: Lei Zuo, Hongyong Xiao, Long Wen, Liang Gao

Institutions: China University of Geosciences, State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, State Key Lab of Digital Manufacturing Equipment and Technology

Awards: G3196852999, G8590355448

OpenAlex ID: W4387449002

FWCI: 3.596

Cites: 35

Cited by: 27

Related to: 10