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A comparative study on metric based meta learning approaches for few-shot image and text classification

Year: 2023

Type: conference-paper

Source: AIP conference proceedings

DOI: 10.1063/5.0175686

Authors: Shraddha Surana, Shravan Ambudkar, Prateek Bihani

Institution: Infosys (India)

Language: English

Topic: Domain Adaptation and Few-Shot Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4387587427

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Cites: 39

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Related to: 10