Effiziente Fehlerratenbestimmung durch KI-basierte Simulation kritischer Szenarien
Year: 2023
Type: article
Source: ATZelektronik
Authors: Raphael Pfeffer, Martin Herrmann, Henning Kemper
Language: German
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4388248752
