Year: 2022
Type: conference-paper
Abstract: The potential for 5 different Machine Learning (ML) classifiers to identify fault type and fault resistance in a DC Microgrid is explored.The ML algorithm are trained using simulated fault data from a 750V Microgrid modelled in PSCAD/EMTDC.The performance of the trained algorithms are tested using real fault data gathered from an operational DC Microgrid.
DOI: 10.2172/2002364
Authors: Samuel Ojetola, Matthew Reno, Jack Flicker, Daniel Bauer, David Stoltzfuz
Institutions: Sandia National Laboratories, Emera (Canada)
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
OpenAlex ID: W4388309194
