Product
Help
Pricing
About
Jobs
Log in
Get started
Work
Add to collection
TlBr Films for Hard X-Ray Imaging
HTML
Details
Locations
Year:
2023
Type:
conference-abstract
DOI:
10.1109/nssmicrtsd49126.2023.10338218
Authors:
M. Squillante,
M. J. Breen,
A. Kargar,
J. F. Christian,
M. Squillante,
O. Maksimov,
P. Battacharya,
L. J. Cirignano,
Y. Ogorodnik,
G. Pinaroli,
M. R. Fuchs,
A. S. Tremsin,
K. S. Karim,
C. C. Scott,
V. V. Nagarkar
show all 15
Institutions:
Radiation Monitoring Devices (United States),
Brookhaven National Laboratory,
National Synchrotron Light Source II,
Space Sciences Laboratory,
University of California, Berkeley
Language:
English
Topic:
Advanced Semiconductor Detectors and Materials
Subfield:
Electrical and Electronic Engineering
Field:
Engineering
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W4389667122
Cites:
Cited by:
3
Related to:
10