Work

Investigation of Negative Capacitance in Admittance Analysis of Metal Semiconductors Interlayered With ZnFe2O4 Doped PVA

Year: 2024

Type: article

Source: IEEE Transactions on Nanotechnology

DOI: 10.1109/tnano.2024.3353379

Authors: Jaafar Abdulkareem Mustafa Alsmael, Serhat Orkun Tan

Institutions: University of Basrah, Karabük University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4390824045

FWCI: 0.797

Cites: 37

Cited by: 5

Related to: 10