Dynamic Testing of a Commercial FRAM Device Under Gamma Ray Dose and Neutron Beam
Year: 2024
Type: article
Authors: Nathan Harris, Wesley Stirk, Dolores Black, Jeffrey Black, Mike Wirthlin, Jeffrey Goeders
Institutions: Brigham Young University, Sandia National Laboratories
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Defense Threat Reduction Agency
Award: G772299097
OpenAlex ID: W4392980051