Work

Double-tip STM for Surface Analysis

Year: 1994
Type: preprint
Abstract: We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.
Authors: Niu, Q., Chang, M. C., Shih, C. K.
Language: English
Open Access status: green
OpenAlex ID: W4394654949
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