A Study of the Effects of Thermal Budget on 3D-NAND Charge Trap Cell Reliability
Work
Year: 2024
Type: article
Institution Micron (United States)
Cites: 18
Cited by:
Related to: 10
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Citation percentile (by year/subfield):
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Sustainable Development Goal Industry, innovation and infrastructure
Open Access status: closed