Work

Investigating the Impact of Signal Resolution on Machine Learning Based Multi-Class Fault Detection

Year: 2024

Type: conference-paper

Source: IEEE Dallas Circuits and Systems Conference (DCAS)

DOI: 10.1109/dcas61159.2024.10539911

Authors: Vehbi Akin, Mutlu Mete

Institution: East Texas A&M University

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4399206403

FWCI:

Cites: 7

Cited by:

Related to: 10