Work

Characterisation of Neutron Irradiated Digital Pixel Test Structures Produced in 65 nm TPSCo CMOS Process

Year: 2024

Type: conference-paper

DOI: 10.7566/jpscp.42.011024

Author: Pascal Becht

Institution: Heidelberg University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

OpenAlex ID: W4399984401

FWCI:

Cites: 13

Cited by: 1

Related to: 10