Work

Increasing the Precision of Transmission Spectroscopy by Optimization of Thin Film Surface Shapes

Year: 2024
Type: preprint
Abstract: While thin film transmission spectroscopy systems can measure semiconductor optical properties, the utilized optimization-based evaluation methods often introduce variances in the results. We introduce a method of optimizing film surface shapes that reduces this uncertainty.
Language: English
Open Access status: green
OpenAlex ID: W4400324563
Cites: 5
Cited by:
Related to: 10