Year: 2024
Type: article
Abstract: We report on the three-dimensional (3D) structure determination of a twisted hexagonal boron nitride (h-BN) heterointerface from a single-view dataset using multislice ptychography. We identify the buried heterointerface between two twisted h-BN flakes with a lateral resolution of 0.57 \AA{} and a depth resolution of 2.5 nm. The latter represents a significant improvement (\ensuremath{\sim}2.7 times) over the aperture-limited depth resolution of incoherent imaging modes, such as annular-dark-field scanning transmission electron microscopy. This improvement is attributed to the diffraction signal extending beyond the aperture edge, with the depth resolution set by the curvature of the Ewald sphere. Future advancements in this approach could enhance the depth resolution to the subnanometer level and enable the identification of individual dopants, defects, and color centers in twisted heterointerfaces and other materials.
Source: Physical Review Applied
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Funders: National Science Foundation, U.S. Department of Energy, Paul Scherrer Institut, Major State Basic Research Development Program of China, Office of Science, Multidisciplinary University Research Initiative, BioXFEL Science and Technology Center, Division of Materials Research, Basic Energy Sciences, Army Research Office, Division of Materials Sciences and Engineering
Awards: G1395360581, G2999910790, G3128650482, G3299242641, G42916606, G4481661474, G5255510351, G6325431000, G7452299184, THREE-DIMENSIONAL CHARACTERIZATION OF NANOMATERIALS AT ATOMIC RESOLUTION USING STEM TOMOGRAPHY, G8178299064, Science and Technology Center on Real-Time Functional Imaging (STROBE)
OpenAlex ID: W4400415354