A single-loop reliability sensitivity analysis strategy for time-dependent rare events with both random variables and stochastic processes
Year: 2024
Type: article
Authors: Congyi Zha, Chenrong Pan, Zhili Sun, Qin Liu
Institutions: Northeastern University, Anhui Xinhua University
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W4400766375