Work

Atom Probe Tomography Investigation of the Impact of Stacking Faults on InGaN/GaN Quantum Well LED Systems

Year: 2024

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1093/mam/ozae044.024

Authors: Ruiying Shu, Rachel A Oliver, Martin Frentrup, Menno J Kappers, Helen Xiu, Gunnar Kusch, David J Wallis, Christina Hofer, Paul A J Bagot, Michael P Moody

Institutions: University of Oxford, University of Cambridge, Cardiff University

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Engineering and Physical Sciences Research Council

Award: G864668184

OpenAlex ID: W4401006214

FWCI:

Cites: 19

Cited by:

Related to: 10