Deep Generative Models-Assisted Automated Labeling for Electron Microscopy Images Segmentation
Year: 2024
Type: preprint
Abstract: Related data for the publication entitled Generative learning of contrast-complexity in electron microscopy for quantifying supported nano-species via unsupervised domain adaptation.Declair: EMcopilot has been registered as a trademark by the Intellectual Property Office of Singapore, No. 40202319264T.
Source: arXiv (Cornell University)
Authors: Yuan, Wenhao, Yao, Bingqing, Tan, Shengdong, You, Fengqi, He, Qian
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: green
OpenAlex ID: W4401201772
