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Deep Generative Models-Assisted Automated Labeling for Electron Microscopy Images Segmentation

Year: 2024
Type: preprint
Abstract: Related data for the publication entitled Generative learning of contrast-complexity in electron microscopy for quantifying supported nano-species via unsupervised domain adaptation.Declair: EMcopilot has been registered as a trademark by the Intellectual Property Office of Singapore, No. 40202319264T.
Authors: Yuan, Wenhao, Yao, Bingqing, Tan, Shengdong, You, Fengqi, He, Qian
Language: English
Open Access status: green
OpenAlex ID: W4401201772
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Cited by: 1
Related to: 10