Application of electronic labels in intelligent inspection of tools and instruments
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3037999
Authors: TieSen Chen, Yang Shi, Zhongzheng Tong
Language: English
Topic: RFID technology advancements
Subfield: Media Technology
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401448784
