Work

A 20-V Pulse Driver Based on All-nMOS Charge Pump Without Reversion Loss and Overstress in 65-nm Standard CMOS Technology

Year: 2024

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2024.3435974

Authors: Ziliang Zhou, Min Tan

Institution: Huazhong University of Science and Technology

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Wuhan National Laboratory for Optoelectronics, National Key Research and Development Program of China

Awards: G1193226780, G6568537593

OpenAlex ID: W4401452363

FWCI: 0.426

Cites: 23

Cited by: 4

Related to: 10