Work

A High-Speed, Low-Power, High-Reliability and Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory

Year: 2024

Type: article

Source: IEEE Transactions on Circuits and Systems I Regular Papers

DOI: 10.1109/tcsi.2024.3438282

Authors: Jiaxin Yang, Ziyang Guo, Shixuan Wang, Jilong Liu, Yue Zhang, Weisheng Zhao, Lang Zeng, Deming Zhang

Institution: Beihang University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Beijing Municipal Natural Science Foundation

Awards: G1044640108, G1601514299, 面向端侧人工智能物联网（AIoT）的高效自旋存算一体芯片, G6737709517, G7664979664

OpenAlex ID: W4401507213

FWCI: 1.238

Cites: 43

Cited by: 12

Related to: 10