Work

Online Junction Temperature Monitoring Method for SiC MOSFETs Based on Turn-Off Miller Plateau Voltage

Year: 2024

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2024.3442546

Authors: Yuhua Quan, Ruiyan Pan, Tiantian Liu, Xuetong Zhou, Junhong Feng, Yufei Tian, Li Zheng, Xinhong Cheng

Institutions: Chinese Academy of Sciences, Shanghai Institute of Microsystem and Information Technology, University of California, Berkeley, University of Chinese Academy of Sciences

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences, Shanghai Rising-Star Program

Awards: G2610628357, G4321183054

OpenAlex ID: W4401536942

FWCI: 0.923

Cites: 17

Cited by: 9

Related to: 10