Work

Research on matching algorithm for automatic testing of automotive instruments

Year: 2024

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3035833

Authors: Chen Li, Chunqiu Tang

Institution: Wuhan University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401628652

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