Work

Application of spatial moment subpixel edge algorithm in chip localization mark extraction

Year: 2024

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3035582

Authors: Li Haihua, Lu Yanmin

Institution: Wenhua College

Language: English

Topic: Image and Object Detection Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401628688

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