Work

Research on visual recognition and localization based on K-means and OTSU

Year: 2024

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3035612

Authors: Wenjie Huang, Weiwei Zhang, Jing Wu, Hong Xu, Haojun Chen, Hongwei Ma

Institution: Dongguan University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401628710

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