Work

Lightweight YOLOv7-tiny for PCB defects small object detection

Year: 2024

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3035584

Authors: Dan Liu, XiangWei Zhu, XuQing Zhou

Institutions: Jiangsu Union Technical Institute, Jinling Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4401632304

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