Work

Improving the yield of CCAT MKID arrays with post-measurement lithographic corrections

Year: 2024

Type: conference-abstract

DOI: 10.1117/12.3020661

Authors: Michael R. Vissers, Jordan D. Wheeler, Jason E. Austermann, Anna K. Vaskuri, Johannes Hubmayr, Jiansong Gao, Zachary B. Huber, Jozsef Imrek, Joel Ullom

Institutions: National Institute of Standards and Technology, Cornell University

Language: English

Topic: Superconducting and THz Device Technology

Subfield: Astronomy and Astrophysics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401632379

Cites:

Cited by: 1

Related to: 10