The Vertical Integrated Spectrometer (VIS) focal plane: orders of magnitude improvement in mm-wave Line Intensity Mapping (LIM) with an inline waveguide-to-on-chip transition
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3021460
Language: English
Subfield: Astronomy and Astrophysics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401633710
