Work

Study on the Sensitivity of Sweep Frequency Eddy Current Probes Using Finite Element Simulation

Year: 2024

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2024.3440992

Authors: A. R. Arjun, B. Sasi, Anish Kumar

Institution: Indira Gandhi Centre for Atomic Research

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401634053

FWCI: 0.538

Cites: 29

Cited by: 4

Related to: 10