Work

TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for Industrial IoT Protocols

Year: 2024

Type: article

Source: IEEE Internet of Things Journal

DOI: 10.1109/jiot.2024.3444893

Authors: Liangyin Chen, Yihan Wang, Xuanyi Xiang, Dian Jin, Yi Ren, Yunhai Zhang, Zhiwen Pan, Yanru Chen

Institutions: Sichuan University, Chinese Academy of Sciences, Institute of Information Engineering

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Sichuan Province Science and Technology Support Program, Fundamental Research Funds for the Central Universities

Awards: G5131404508, G6585533751, G6673539751, G8052425231, G8670868267, 基于深度学习的实用型物联网物理层密钥生成和安全通信方法研究

OpenAlex ID: W4401634110

FWCI: 7.273

Cites: 29

Cited by: 7

Related to: 10