Evaluating residual stresses of Pt thin films for use as reflective layers on astronomical x-ray gratings
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3033678
Institutions: Pennsylvania State University, Cornell University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401635305
