Highly Reliable Lateral Migration-Based TFT-Type Neuron Device for Spiking Neural Networks
Year: 2024
Type: article
Source: IEEE Electron Device Letters
Institutions: Seoul National University, Kookmin University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G8432366792
OpenAlex ID: W4401687403