GaN thickness dependence of GaN/AlN superlattices on face-to-face-annealed sputter-deposited AlN templates
Year: 2024
Type: article
Abstract: Recently, deep-ultraviolet (DUV) light-emitting devices have attracted attention for various applications. GaN/AlN superlattices have emerged as a promising alternative for achieving high-efficiency DUV emission. To fabricate superlattices with high crystal quality and abrupt interfaces, we have utilized face-to-face-annealed sputter-deposited AlN template substrates characterized by a flat surface and low dislocation density. Furthermore, radio-frequency plasma-assisted molecular beam epitaxy with in situ reflection high-energy electron diffraction monitoring was employed for the growth process. The growth of the superlattices follows a specific sequence. Step 1: AlN growth, Step 2: conversion of Al droplets to AlN, Step 3: GaN growth, and Step 4: evaporation of Ga droplets. This study explored the impact of GaN thickness on the GaN/AlN superlattice. The GaN thickness was linearly controlled by changing the duration of Step 3. This approach allowed for the growth of a flat GaN layer up to 1 monolayer (ML) and achieved superlattices with abrupt interfaces. Single-peak cathodoluminescence (CL) emission at 240–245 nm was observed from the superlattices, with the peak shift toward longer wavelengths as the GaN thickness increased. In contrast, quantum dot-like GaN islands were generated with a thickness of over 1 ML, induced by compressive strain. Superlattices with thicker GaN exhibited broad CL emission with multiple peaks. However, the AlN barrier layer reduced the surface roughness and maintained abrupt interfaces within the superlattices. Therefore, to obtain sharp single-peak UV emission from GaN/AlN superlattices, the growth sequence should be controlled to obtain flat GaN layers without dots.
Source: Journal of Applied Physics
DOI: 10.1063/5.0223215
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,500
Awards: Growth of High-Quality Indium-Based Nitride Semiconductors by High-Pressure, High-Temperature Thermal Processing and Their Application to Thermoelectric Devices, 窒化物半導体の結晶極性起因の逆符号分極電荷制御による量子閉じ込め構造の構築, G2262516535, Non-polar growth of AlGaN nitride semiconductor and its application in deep ultraviolet LEDs, 局所電流注入による窒化物半導体の発光効率分布可視化手法の開発, G4679555289, G4923174039, G6038983638, G6177793993, Study on three-dimensional lattice-matched epitaxy in nitride semiconductor crystal growth, G8000061644
OpenAlex ID: W4401702726
