Work

Mechanism and Physical Model of the Single-Event Leakage Current for SiC JBS Diodes

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3446850

Authors: Xiaoping Dong, Mingmin Huang, Yao Ma, Chengwen Fu, Mu He, Zhimei Yang, Yun Li, Min Gong

Institution: Sichuan University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Sichuan Province

Award: G1620898029

OpenAlex ID: W4401725522

FWCI: 1.135

Cites: 36

Cited by: 11

Related to: 10