Work

Comprehensive Characterization Method for Modeling Retention Transients in NAND Flash Memory

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3442984

Authors: Wen-Chien Liu, Yung-Yueh Chiu, Toshiaki Takeshita, Riichiro Shirota

Institutions: National Tsing Hua University, National Yang Ming Chiao Tung University, Winbond (Taiwan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401748806

FWCI: 0.104

Cites: 20

Cited by: 1

Related to: 10