Analysis of Channel Current Noise in Small Nanoscale Metal Oxide Semiconductor Field Effect Transistors
Year: 2024
Type: article
Source: Small
Authors: Xiaofei Jia, Qun Wei, Yan Zhu, Wenpeng Zhang, Liang He
Institutions: Ankang University, Xidian University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4401769402