Work

Sensing High-Density IC Substrates: Adaptive Fractional Differentiation for Accurate Image Segmentation

Year: 2024

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2024.3444496

Authors: Yongxing Yu, Dan Huang, Yueming Hu, Rongjun Chen, Xu Lu

Institutions: South China University of Technology, North China Electric Power University, Guangdong Polytechnic Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Changchun Science and Technology Planning Project

Awards: G689886098, G8961075769

OpenAlex ID: W4401806162

FWCI: 0.636

Cites: 50

Cited by: 3

Related to: 10